Jesd 78d
WebLatch up current, per JESD78D 400 mA. DG9424E, DG9425E, DG9426E www.vishay.com Vishay Siliconix S23-0124-Rev. D, 06-Mar-2024 3 Document Number: 75770 For technical questions, contact: [email protected] THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. WebJESD78F.01. Dec 2024. This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this standard is to establish a method for determining IC latch-up characteristics and to define latch-up detection criteria. Latch-up characteristics are extremely important in determining product reliability ...
Jesd 78d
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Web(Revision of JESD78D, November 2011) APRIL 2016 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION Downloaded by xu yajun ([email protected]) on Jan … WebCMOS circuit latchup (for example) is explained here. The purpose of the JEDEC document specified is to test a particular device to see if it is vulnerable to latchup. It does this by …
WebJESD78F.01. Dec 2024. This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this standard is to establish a method for … Web3. Determined according to JEDEC Standard JESD78D, IC Latch-up Test. • Test was performed at 105 °C case temperature (Class II). • I/O pins pass ±100 mA I-test with IDD …
Web2 ago 2012 · Both are standsrd tests defined by JEDEC, a member of the Electronic Industries Alliance ().. JESD17 (the document is not available anymore) is an old … WebLatch-up performance exceeds 100 mA per JESD78D Class II Inputs accept voltages up to 2.75 V Low noise overshoot and undershoot < 10% of VCCO IOFF circuitry provides partial power-down mode operation Multiple package options Specified from 40 Cto+85 C 3. Ordering information Table 1. Ordering information 4. Marking Table 2.
WebJEDEC JESD 78, Revision F, January 2024 - IC Latch-Up Test. This standard establishes the procedure for testing, evaluation and classification of devices and microcircuits …
Web23 nov 2024 · JEDEC JESD 78D:2011 ; Categories associated with this Standard - (Show below) - (Hide below) Sub-Categories associated with this Standard - (Show below) - (Hide below) View more information Access your standards online with a subscription. Features ... assam bengalassam bestWeb• Latch-up performance exceeds 100 mA per JESD78D Class II • Inputs accept voltages up to 5.5 V • Low noise overshoot and undershoot < 10% of VCCO • IOFF circuitry provides partial power-down mode operation • Specified from -40 °C to +125 °C. Nexperia 74AXP8T245 8-bit dual supply translating transceiver; 3-state assam bhawan new delhiWeb• Latch-up performance exceeds 100 mA per JESD78D Class II • Inputs accept voltages up to 5.5 V • Low noise overshoot and undershoot < 10% of VCCO • IOFF circuitry provides partial power-down mode operation • Specified from -40 °C to +125 °C. Nexperia 74AXP4T245 4-bit dual supply translating transceiver; 3-state assam bharat ratnaWeb74HC138 Product details. Description. The 74HC138 is a high speed CMOS device. The device accepts a three bit binary weighted address on input pins A0, A1 and A2 and when enabled will produce one active low output with the remaing seven being high. There are two active LOW enable inputs E1 and E2, and one active HIGH enable input E3. assam bhawan menuWebThe 74AXP4T245 is an 4-bit dual supply translating transceiver with 3-state outputs that enable bidirectional level translation. The device can be used as two 2-bit transceivers or … assam bhumiputraWeb3. Determined according to JEDEC Standard JESD78D, IC Latch-up Test. • Test was performed at 125 °C case temperature (Class II). • I/O pins pass ±100 mA I-test with IDD … assam bhawan kolkata